ADVANCED PRECISION TESTING TECHNOLOGY CO., LTD.

Electrical measurement instruments,Probe Station,Test Fixture,RO Water System...

News
  • No News
Category
  • No Category
Search
 
You are now at: Home » Products » Semiconductor CharacterizationSystem
Semiconductor CharacterizationSystem
Large
Products:
Semiconductor CharacterizationSystem
Brand:
Semiconductor CharacterizationSystem
Price: Negotiable
Min. Order:
Total Quantity:
Delivery:
Valid until: Never Expire
Updated: 2024-05-04 13:39
Details
Windows operating system working with KITE GUI test interface software.
 To combine IV, CV, PULSE, SCOPE and other measurement models in one machine
 With nine sockets available for arranging a variety of measurement models
 High-powered SMU(1A max),0.1fA current resolution capacity
 Capacity of running multi-test
 Excel/ASCII file format
 Built-in network interface card, GPIB, RS232, printer interface, multiple project-testing procedure (IV, CV, Pulse, Flash, transint, Solar), widely adopted in semiconductor, photoelectric and solar photovoltaic industries as well as in academic fields.